Singh, N. An Artificial Intelligence Approach to Test Generation. Springer International Publishing.
Style de citation Chicago (17e éd.)Singh, Narinder. An Artificial Intelligence Approach to Test Generation. Cham: Springer International Publishing.
Style de citation MLA (8e éd.)Singh, Narinder. An Artificial Intelligence Approach to Test Generation. Springer International Publishing.
אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.