Singh, N. An Artificial Intelligence Approach to Test Generation. Springer International Publishing.
Cita Chicago (17th ed.)Singh, Narinder. An Artificial Intelligence Approach to Test Generation. Cham: Springer International Publishing.
Cita MLA (8th ed.)Singh, Narinder. An Artificial Intelligence Approach to Test Generation. Springer International Publishing.
Atenció: Aquestes cites poden no estar 100% correctes.