Built-in-self-test and digital self-calibration for RF SoCs
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computin...
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| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
New York, NY :
Springer New York
2012.
Cham : Springer Nature |
| Col·lecció: | SpringerBriefs in Electrical and Computer Engineering
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| Matèries: | |
| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Built-in-Self-Test and Digital Self-Calibration for RF SoCs, Texte imprimé, 9781441995476 • Built-in-Self-Test and Digital Self-Calibration for RF SoCs, Texte imprimé, 9781441995490 |