Life-Cycle Assessment of Semiconductors

Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information te...

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Detalhes bibliográficos
Autor principal: Boyd, Sarah B.
Formato: Livre numérique
Idioma:Anglais
Publicado em: New York, NY : Springer New York [20..].
Cham : Springer Nature
Edição:1st ed. 2012.
Acesso em linha:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
Nota: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Life-Cycle Assessment of Semiconductors, Texte imprimé, 9781441999870
Sumário:
  • 1 Introduction 2 Semiconductor LCI Methods 3 Semiconductor Manufacturing Trends in Product Type and Geography 4 Life-cycle Energy and Global Warming Emissions of CMOS Logic 5 Life-cycle Assessment of CMOS Logic 6 Life-cycle Assessment of Flash Memory 7 Life-cycle Assessment of Dynamic Random Access Memory 8 Semiconductor LCA: The Road Ahead