From scientific instrument to industrial machine : Coping with architectural stress in embedded systems
Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In From scientific instrument to industrial machine, we look at the phenomenon of architectural stress in embedded systems in the context of a...
Enregistré dans:
| Hovedforfatter: | |
|---|---|
| Andre forfattere: | |
| Format: | Livre numérique |
| Sprog: | Anglais |
| Udgivet: |
Dordrecht :
Springer Netherlands
[20..].
Cham : Springer Nature |
| Udgivelse: | 1st ed. 2012. |
| Serier: | SpringerBriefs in Electrical and Computer Engineering
|
| Online adgang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Kommentar: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • From scientific instrument to industrial machine, coping with architectural stress in embedded systems, Richard Doornbos, Sjir van Loo, editors, Dordrecht, Springer, 2012, 1 vol. (XII-112 p.), SpringerBriefs in electrical and computer engineering, 978-94-0074146-1 • From scientific instrument to industrial machine, Texte imprimé, 9789400741485 • From scientific instrument to industrial machine, coping with architectural stress in embedded systems, Richard Doornbos, Sjir van Loo, editors, Dordrecht, Springer, 2012, 1 vol. (XII-112 p.), SpringerBriefs in electrical and computer engineering, 978-94-0074146-1 • From scientific instrument to industrial machine, Texte imprimé, 9789400741485 • From scientific instrument to industrial machine, coping with architectural stress in embedded systems, Richard Doornbos, Sjir van Loo, editors, Dordrecht, Springer, 2012, 1 vol. (XII-112 p.), SpringerBriefs in electrical and computer engineering, 978-94-0074146-1 |
| LEADER | 05395nam a22003857a 4500 | ||
|---|---|---|---|
| 001 | 958520 | ||
| 008 | 130325q2000 xx ||| |||| 00| 0 eng d | ||
| 009 | PPN168337177 | ||
| 020 | |a 9789400741478 | ||
| 041 | 0 | |a eng | |
| 082 | |a 621.36 | ||
| 100 | 1 | |a Doornbos, Richard. | |
| 245 | 1 | 0 | |a From scientific instrument to industrial machine : |b Coping with architectural stress in embedded systems |c edited by Richard Doornbos, Sjir van Loo. |
| 250 | |a 1st ed. 2012. | ||
| 260 | |a Dordrecht : |b Springer Netherlands. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a SpringerBriefs in Electrical and Computer Engineering |x 2191-8120 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a Foreword Acknowledgements Part I Introduction 1. The Endeavor Part II Architecture 2. Systems Architecture 3. Feasibility prototyping 4. Software architecture Part III Automation and control functions 5. Applications in automated microscopy 6. Focusing control 7. Positioning control Part IV Conclusion 8. Final words Appendix. Condor Project Publications | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In From scientific instrument to industrial machine, we look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company. Traditionally, transmission electron microscopes are manually operated scientific instruments, but they also have enormous potential for use in industrial applications. However, this new market has quite different characteristics. There are strong demands for cost-effective analysis, accurate and precise measurements, and ease-of-use. These demands can be translated into new system qualities, e.g. reliability, predictability and high throughput, as well as new functions, e.g. automation of electron microscopic analyses, automated focusing and positioning functions.From scientific instrument to industrial machine takes a pragmatic approach to the problem of architectural stress. In particular, it describes the outcomes of the Condor project, a joint endeavour by a consortium of industrial and academic partners. In this collaboration an integrated approach was essential to successfully combine various scientific results and show the first steps towards a new direction. System modelling and prototyping were the key techniques to develop better understanding and innovative solutions to the problems associated with architectural stress.From scientific instrument to industrial machine is targeted mainly at industrial practitioners, in particular system architects and engineers working on high tech systems. It can therefore be read without particular knowledge of electron microscope systems or microscopic applications. The book forms a bridge between academic and applied science, and high tech industrial practice. By showing the approaches and solutions developed for the electron microscope, it is hoped that system designers will gain some insights in how to deal with architectural stress in similar challenges in the high tech industry | ||
| 700 | 1 | |a Loo, Sjir van. |4 pbd | |
| 776 | 0 | |0 165244453 |t From scientific instrument to industrial machine |o coping with architectural stress in embedded systems |f Richard Doornbos, Sjir van Loo, editors |c Dordrecht |n Springer |d 2012 |p 1 vol. (XII-112 p.) |s SpringerBriefs in electrical and computer engineering |z 978-94-0074146-1 | |
| 776 | 0 | |t From scientific instrument to industrial machine |b Texte imprimé |z 9789400741485 | |
| 776 | 0 | |0 165244453 |t From scientific instrument to industrial machine |o coping with architectural stress in embedded systems |f Richard Doornbos, Sjir van Loo, editors |c Dordrecht |n Springer |d 2012 |p 1 vol. (XII-112 p.) |s SpringerBriefs in electrical and computer engineering |z 978-94-0074146-1 | |
| 776 | 0 | |t From scientific instrument to industrial machine |b Texte imprimé |z 9789400741485 | |
| 776 | 0 | |0 165244453 |t From scientific instrument to industrial machine |o coping with architectural stress in embedded systems |f Richard Doornbos, Sjir van Loo, editors |c Dordrecht |n Springer |d 2012 |p 1 vol. (XII-112 p.) |s SpringerBriefs in electrical and computer engineering |z 978-94-0074146-1 | |
| 856 | 4 | |q PDF |u https://doi.org/10.1007/978-94-007-4147-8 |z Accès sur la plateforme de l'éditeur | |
| 856 | 4 | |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-W7PWXTF0-Z |z Accès sur la plateforme Istex | |
| 856 | 4 | |5 452349901:749136391 |u https://ezproxy.univ-orleans.fr/login?url=https://dx.doi.org/10.1007/978-94-007-4147-8 |z Accès Université d'Orléans | |
| 856 | 4 | |5 180339901:752145614 |u https://ezproxy.insa-cvl.fr/login?qurl=https://dx.doi.org/10.1007/978-94-007-4147-8 |z Accès INSA CVL | |
| 997 | |0 958520 |1 Livre numérique |a Ressource numérique |b INSA |b ENSA |c 0/Bibliothèque numérique/ |c 1/Bibliothèque numérique/Autre ressource numérique/ | ||