Analog and Mixed-Signal Boundary-Scan : :: SCD d'Orléans

Analog and Mixed-Signal Boundary-Scan : A Guide to the IEEE 1149.4 Test Standard

Analog and Mixed-Signal Boundary-Scan : A Guide to the IEEE 1149.4 Test Standard

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Detaylı Bibliyografya
Diğer Yazarlar:	Osseiran, Adam, 19..-...., auteur en microélectronique (Kolaboratör)
Materyal Türü:	Livre numérique
Dil:	Anglais
Baskı/Yayın Bilgisi:	Cham : Springer International Publishing [20..]. Cham : Springer Nature
Online Erişim:	Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL
Not:	Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale)
Autres localisations:	Voir dans le Sudoc
Edition sous un autre format:	• Analog and Mixed-Signal Boundary-Scan, A Guide to the IEEE 1149.4 Test Standard

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