Transmission electron microscopy and diffractometry of materials
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...
محفوظ في:
| المؤلفون الرئيسيون: | , |
|---|---|
| التنسيق: | Livre numérique |
| اللغة: | Anglais |
| منشور في: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer
[20..].
Cham : Springer Nature |
| الطبعة: | 4th ed. 2013. |
| سلاسل: | Graduate Texts in Physics
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| الوصول للمادة أونلاين: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| ملاحظة: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Transmission electron microscopy and diffractometry of materials, Brent Fultz, James Howe, 4th edition, 2013, Berlin, Springer, 1 vol. (xx- 761 p.), 978-3-642-29760-1 |
جدول المحتويات:
- Diffraction and X-Ray Powder Diffractometer Problems TEM and its Optics Problems Neutron Scattering Problems Scattering Problems Inelastic Electron Scattering and Spectroscopy Problems Diffraction from Crystals Sphere Problems Electron Diffraction and Crystallography Problems Diffraction Contrast in TEM Images Problems Diffraction Lineshapes Problems Patterson Functions and Diffuse Scattering Problems High-Resolution TEM Imaging Problems High-Resolution STEM and Related Imaging Techniques Problems Dynamical Theory Problems