Transmission electron microscopy and diffractometry of materials
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...
Gespeichert in:
| Hauptverfasser: | , |
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| Format: | Livre numérique |
| Sprache: | Anglais |
| Veröffentlicht: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer
[20..].
Cham : Springer Nature |
| Ausgabe: | 4th ed. 2013. |
| Schriftenreihe: | Graduate Texts in Physics
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| Edition sous un autre format: | • Transmission electron microscopy and diffractometry of materials, Brent Fultz, James Howe, 4th edition, 2013, Berlin, Springer, 1 vol. (xx- 761 p.), 978-3-642-29760-1 |
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| 100 | 1 | |a Fultz, Brent. | |
| 245 | 1 | 0 | |a Transmission electron microscopy and diffractometry of materials |c by Brent Fultz, James Howe. |
| 250 | |a 4th ed. 2013. | ||
| 260 | |a Berlin, Heidelberg : |b Springer Berlin Heidelberg : |b Imprint: Springer. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a Graduate Texts in Physics |x 1868-4513 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a Diffraction and X-Ray Powder Diffractometer Problems TEM and its Optics Problems Neutron Scattering Problems Scattering Problems Inelastic Electron Scattering and Spectroscopy Problems Diffraction from Crystals Sphere Problems Electron Diffraction and Crystallography Problems Diffraction Contrast in TEM Images Problems Diffraction Lineshapes Problems Patterson Functions and Diffuse Scattering Problems High-Resolution TEM Imaging Problems High-Resolution STEM and Related Imaging Techniques Problems Dynamical Theory Problems | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises | ||
| 700 | 1 | |a Howe, James M, |d 1955- |4 aut | |
| 776 | 0 | |0 191880825 |t Transmission electron microscopy and diffractometry of materials |f Brent Fultz, James Howe |e 4th edition |d 2013 |c Berlin |n Springer |p 1 vol. (xx- 761 p.) |z 978-3-642-29760-1 | |
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