Acoustic scanning probe microscopy
The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive...
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| Hlavní autor: | |
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| Další autoři: | , |
| Médium: | Livre numérique |
| Jazyk: | Anglais |
| Vydáno: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Vydání: | 1st ed. 2013. |
| Edice: | NanoScience and Technology
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| On-line přístup: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Poznámka: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Acoustic Scanning Probe Microscopy, Texte imprimé, 9783642274930 • Acoustic Scanning Probe Microscopy, Texte imprimé, 9783642430794 • Acoustic Scanning Probe Microscopy, Texte imprimé, 9783642274954 |
Obsah:
- From the contents: Overview of acoustic techniques Contact dynamics modelling Cantilever dynamics: theoretical modeling Finite elements modelling AFAM calibration Enhanced sensitivity UAFM Holography calibration UFM Friction/lateral techniques Harmonix Scanning microdeformation microscopy (SMM) Tip wear Comparison with other techniques Applications polymer Thin films