Progress in Nano-Electro-Optics IV : Characterization of Nano-Optical Materials and Optical Near-Field Interactions

This volume focuses on the characterization of nano-optical materials and optical-near field interactions. It begins with the techniques for characterizing the magneto-optical Kerr effect and continues with methods to determine structural and optical properties in high-quality quantum wires with hig...

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Gorde:
Xehetasun bibliografikoak
Egile nagusia: Ohtsu, Motoichi
Formatua: Livre numérique
Hizkuntza:Anglais
Argitaratua: Berlin, Heidelberg : Springer Berlin Heidelberg [20..].
Cham : Springer Nature
Edizioa:1st ed. 2005.
Saila:Springer Series in Optical Sciences 109
Sarrera elektronikoa:Accès sur la plateforme de l'éditeur
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Oharra: Archives Springer e-books (Licence nationale)
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Edition sous un autre format:• Progress in nano-electro-optics IV, characterization of nano-optical materials and optical near-field interactions, Motoichi Ohtsu (ed.), Berlin, Springer, 2005, 1 vol. (XIV-206 p.), Springer series in optical sciences, 3-540-23236-2
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505 1 |a Near-Field Imaging of Magnetic Domains Improvement of Interface Quality in Cleaved-Edge-Overgrowth GaAs Quantum Wires Based on Micro-optical Characterization Recombination Dynamics in InxGa1 xN-Based Nanostructures Quantum Theory of Radiation in Optical Near Field Based on Quantization of Evanescent Electromagnetic Waves Using Detector Mode 
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520 |a This volume focuses on the characterization of nano-optical materials and optical-near field interactions. It begins with the techniques for characterizing the magneto-optical Kerr effect and continues with methods to determine structural and optical properties in high-quality quantum wires with high spatial uniformity. Further topics include: near-field luminescence mapping in InGaN/GaN single quantum well structures in order to interpret the recombination mechanism in InGaN-based nano-structures; and theoretical treatment of the optical near field and optical near-field interactions, providing the basis for investigating the signal transport and associated dissipation in nano-optical devices. Taken as a whole, this overview will be a valuable resource for engineers and scientists working in the field of nano-electro-optics 
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