Dynamic characterisation of analogue-to-digital converters
The Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for system s performance and flexibility. Knowing accurately all the param...
Αποθηκεύτηκε σε:
| Κύριοι συγγραφείς: | , |
|---|---|
| Μορφή: | Livre numérique |
| Γλώσσα: | Anglais |
| Έκδοση: |
New York, NY :
Springer US
[20..].
Cham : Springer Nature |
| Έκδοση: | 1st ed. 2005. |
| Σειρά: | The Springer International Series in Engineering and Computer Science
860 |
| Διαθέσιμο Online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Σημείωση: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Dynamic Characterisation of Analogue-to-Digital Converters, Texte imprimé, 9780387259024 • Graph-theoretic concepts in computer science, proceedings, International workshop WG '88, Amsterdam, the Netherlands, June 15-17, 1988, Berlin, Springer-Verlag, 1989, 1 vol. (VII-457 p.), Lecture notes in computer science, 3-540-50728-0 • Dynamic Characterisation of Analogue-to-Digital Converters, Texte imprimé, 9781441938497 |
Πίνακας περιεχομένων:
- ADC Characterisation Based on Sinewave Analysis ADC Applications, Architectures and Terminology Sinewave Test Setup Time-Domain Data Analysis Frequency-Domain Data Analysis Code Histogram Test Comparative Study of ADC Sinewave Test Methods Measurement of Additional Parameters Jitter Measurement Differential Gain and Phase Testing Step and Transient Response Measurement Hysteresis Measurement