FIB nanostructures
FIB Nanostructures reviews a range of methods, including milling, etching, deposition, and implantation, applied to manipulate structures at the nanoscale. Focused Ion Beam (FIB) is an important tool for manipulating the structure of materials at the nanoscale, and substantially extends the range of...
Guardat en:
| Altres autors: | |
|---|---|
| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
Cham :
Springer International Publishing
[20..].
Cham : Springer Nature |
| Edició: | 1st ed. 2013. |
| Col·lecció: | Lecture Notes in Nanoscale Science and Technology
20 |
| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • FIB Nanostructures, Texte imprimé, 9783319028736 • FIB Nanostructures, Texte imprimé, 9783319028750 • FIB Nanostructures, Texte imprimé, 9783319374680 |
Taula de continguts:
- Preface Chapter 1: Focused Ion Beam (FIB) technology for micro and nanoscale fabrications Chapter 2: Epitaxial ferroelectric nanostructures fabricated by FIB milling Chapter 3: Low current focused-ion-beam milling for freestanding nanomaterial characterization Chapter 4: Focused ion beam milling of carbon nanotube yarns and Bucky-papers: Correlating their internal structure with their macro-properties Chapter 5: Nanoscale electrical contacts grown by Focused-Ion-Beam (FIB) Induced Deposition Chapter 6: Metal induced crystallization of focused ion beam induced deposition for functional patterned ultrathin nanocarbon Chapter 7: Deterministic Fabrication of Micro- and Nano-Structures by Focused Ion Beam Chapter 8: Application of ion beam processes to scanning probe microscopy Chapter 9: Fabrication of needle-shaped specimens containing sub-surface nanostructures for Electron Tomography Chapter 10: Fabrication technique of deformation carriers (gratings and speckle patterns) with FIB for micro/nano-scale deformation measurement Chapter 11: Controlled Quantum Dot Formation on Focused Ion Beam patterned GaAs Substrates Chapter 12: Development of Functional Metallic Glassy Materials by FIB and Nano-imprint Technologies Chapter 13: Nanostructured Materials Driven by Dielectrophoresis on Nanoelectrods Patterned by Focused Ion Beam Chapter 14: Focused Ion Beam Assisted Nano-Scale Processing and Thermoelectrical Characterization Chapter 15: FIB design for Nanofluidic applications Chapter 16: FIB Patterning of Stainless Steel for the Development of Nano-Structured Stent Surfaces for Cardiovascular Applications Chapter 17: Evaluation of damages induced by Ga+ focused ion beam in piezoelectric nanostructures Chapter 18: Instabilities in Focused Ion Beam-patterned nanostructures Chapter 19: Nanostructures by mass-separated FIB Index