Ellipsometry at the nanoscale
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology...
Enregistré dans:
| Andre forfattere: | , |
|---|---|
| Format: | Livre numérique |
| Sprog: | Anglais |
| Udgivet: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
2013.
Cham : Springer Nature |
| Online adgang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Kommentar: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Ellipsometry at the nanoscale, Maria Losurdo, Kurt Hingerl, ..., Heidelberg, Springer, 2013, 1 vol. (XV-730 p.), 978-3-642-33955-4 |
Indholdsfortegnelse:
- Preamble Preface A Brief History and State of the Art of Ellipsometry.-Advanced Mueller Ellipsometry Instrumentation and Data Analysis Data Analysis for Nanomaterials: Effective Medium Approximation, its Limits and Implementations Relationship between Surface Morphology and Effective Medium Roughness Plasmonics and Effective-Medium Theory Thin films of Nanostructured Plasmonic Noble Metals.- Spectroscopic Ellipsometry on Metallic Gratings Mueller matrix applied to nanostructures Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles Generalized Ellipsometry Characterization of Sculptured Thin Films made by Glancing Angle Deposition THz Generalized Ellipsometry characterization of highly-ordered 3-dimensional Nanostructures Infrared ellipsometric investigations of free carriers and lattice vibrations in superconducting cuprates Real-time Ellipsometry for Probing charge-transfer processes at the nanoscale Polarimetric and other Optical Probes for the Solid - Liquid Interface Spectroscopic Ellipsometry for functional nano-layers of flexible organic electronic devices Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications Ellipsometry of semiconductor nanocrystals Spectroscopic Ellipsometry for Inline Process Control in the Semiconductor Industry Thin film applications in research and industry characterized by spectroscopic ellipsometry Ellipsometry and Correlation Measurements Nanotechnology: Applications and markets, present and future