Ellipsometry at the nanoscale
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology...
সংরক্ষণ করুন:
| অন্যান্য লেখক: | , |
|---|---|
| বিন্যাস: | Livre numérique |
| ভাষা: | Anglais |
| প্রকাশিত: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
2013.
Cham : Springer Nature |
| অনলাইন ব্যবহার করুন: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| টীকা: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Ellipsometry at the nanoscale, Maria Losurdo, Kurt Hingerl, ..., Heidelberg, Springer, 2013, 1 vol. (XV-730 p.), 978-3-642-33955-4 |
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| 245 | 0 | 0 | |a Ellipsometry at the nanoscale |c edited by Maria Losurdo, Kurt Hingerl. |
| 260 | |a Berlin, Heidelberg : |b Springer Berlin Heidelberg. | ||
| 260 | |a Cham : |b Springer Nature, |c 2013. | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a Preamble Preface A Brief History and State of the Art of Ellipsometry.-Advanced Mueller Ellipsometry Instrumentation and Data Analysis Data Analysis for Nanomaterials: Effective Medium Approximation, its Limits and Implementations Relationship between Surface Morphology and Effective Medium Roughness Plasmonics and Effective-Medium Theory Thin films of Nanostructured Plasmonic Noble Metals.- Spectroscopic Ellipsometry on Metallic Gratings Mueller matrix applied to nanostructures Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles Generalized Ellipsometry Characterization of Sculptured Thin Films made by Glancing Angle Deposition THz Generalized Ellipsometry characterization of highly-ordered 3-dimensional Nanostructures Infrared ellipsometric investigations of free carriers and lattice vibrations in superconducting cuprates Real-time Ellipsometry for Probing charge-transfer processes at the nanoscale Polarimetric and other Optical Probes for the Solid - Liquid Interface Spectroscopic Ellipsometry for functional nano-layers of flexible organic electronic devices Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications Ellipsometry of semiconductor nanocrystals Spectroscopic Ellipsometry for Inline Process Control in the Semiconductor Industry Thin film applications in research and industry characterized by spectroscopic ellipsometry Ellipsometry and Correlation Measurements Nanotechnology: Applications and markets, present and future | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications | ||
| 700 | 1 | |a Losurdo, Maria. |4 pbd | |
| 700 | 1 | |a Hingerl, Kurt. |4 pbd | |
| 776 | 0 | |0 169886530 |t Ellipsometry at the nanoscale |f Maria Losurdo, Kurt Hingerl, ... |c Heidelberg |n Springer |d 2013 |p 1 vol. (XV-730 p.) |z 978-3-642-33955-4 | |
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