New Horizons of Applied Scanning Electron Microscopy
In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realize...
Guardado en:
| Autores principales: | , |
|---|---|
| Formato: | Livre numérique |
| Lenguaje: | Anglais |
| Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Edición: | 1st ed. 2010. |
| Colección: | Springer Series in Surface Sciences
45 |
| Acceso en línea: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • New Horizons of Applied Scanning Electron Microscopy, Texte imprimé, 9783642031618 • New Horizons of Applied Scanning Electron Microscopy, Texte imprimé, 9783642261688 • New horizons of applied scanning electron microscopy, Kenichi Shimizu, Tomoaki Mitani, Berlin, Springer, 2010, 1 vol. (XIV-179 p.), Springer series in surface sciences, 978-3-642-03159-5 |