Rare-Earth Implanted MOS Devices for Silicon Photonics : Microstructural, Electrical and Optoelectronic Properties
The book concentrates on the microstructural, electric and optoelectronic properties of rare-earth implanted MOS structures and their use as light emitters in potential applications. It describes the structural formation processes in the gate oxide during fabrication and under operation, how this mi...
Enregistré dans:
| Auteurs principaux: | , |
|---|---|
| Format: | Livre numérique |
| Sprog: | Anglais |
| Udgivet: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
2010.
Cham : Springer Nature |
| Serier: | Springer Series in Materials Science
142 |
| Online adgang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Kommentar: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Rare-Earth Implanted MOS Devices for Silicon Photonics, Texte imprimé, 9783642144462 • Rare-Earth Implanted MOS Devices for Silicon Photonics, Texte imprimé, 9783642144486 • Rare-Earth Implanted MOS Devices for Silicon Photonics, Texte imprimé, 9783642265587 |
Indholdsfortegnelse:
- Silicon-Based Light Emission
- Microstructure
- Electrical Properties
- Electroluminescence Spectra
- Electroluminescence Efficiency
- Stability and Degradation
- Applications.