Emerging technologies and circuits
With the semiconductor market growth, new Integrated Circuit designs are pushing the limit of the technology and in some cases, require specific fine-tuning of certain process modules in manufacturing. Thus the communities of design and technology are increasingly intertwined. The issues that requir...
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| Autres auteurs: | , , |
|---|---|
| Format: | Livre numérique |
| Langue: | Anglais |
| Publié: |
Dordrecht :
Springer Netherlands
[20..].
Cham : Springer Nature |
| Édition: | 1st ed. 2010. |
| Collection: | Lecture Notes in Electrical Engineering
66 |
| Accès en ligne: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Note: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Emerging technologies and circuits, Amara Amara, Thomas Ea, Marc Belleville., 2010, Dordrecht, Springer, 1 vol. (IX-264 p.), Lecture notes in electrical engineering, 978-90-481-9378-3 |
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| 245 | 0 | 0 | |a Emerging technologies and circuits |c edited by Amara Amara, Thomas Ea, Marc Belleville. |
| 250 | |a 1st ed. 2010. | ||
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| 505 | 1 | |a Synergy Between Design and Technology: A Key Factor in the Evolving Microelectronic Landscape EMERGING TECHNOLOGY AND DEVICES New State Variable Opportunities Beyond CMOS: A System Perspective A Simple Compact Model to Analyze the Impact of Ballistic and Quasi-Ballistic Transport on Ring Oscillator Performance ADVANCED DEVICES AND CIRUITS Low-Voltage Scaled 6T FinFET SRAM Cells Independent-Double-Gate FINFET SRAM Cell for Drastic Leakage Current Reduction Metal Gate Effects on a 32 nm Metal Gate Resistor RELIABILITY AND SEU Threshold Voltage Shift Instability Induced by Plasma Charging Damage in MOSFETS with High-K Dielectric Analysis of SI Substrate Damage Induced by Inductively Coupled Plasma Reactor with Various Superposed Bias Frequencies POWER, TIMING AND VARIABILITY CMOS SOI Technology for WPAN: Application to 60 GHZ LNA SRAM Memory Cell Leakage Reduction Design Techniques in 65 nm Low Power PD-SOI CMOS Resilient Circuits for Dynamic Variation Tolerance Process Variability-Induced Timing Failures A Challenge in Nanometer CMOS Low-Power Design How Does Inverse Temperature Dependence Affect Timing Sign-Off CMOS Logic Gates Leakage Modeling Under Statistical Process Variations On-Chip Circuit Technique for Measuring Jitter and Skew with Picosecond Resolution ANALOG AND MIXED SIGNAL DC DC Converter Technologies for On-Chip Distributed Power Supply Systems 3D Stacking and Hybrid Operation Sampled Analog Signal Processing: From Software-Defined to Software Radio | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a With the semiconductor market growth, new Integrated Circuit designs are pushing the limit of the technology and in some cases, require specific fine-tuning of certain process modules in manufacturing. Thus the communities of design and technology are increasingly intertwined. The issues that require close interactions and collaboration for trade-off and optimization across the design/device/process fields are addressed in Emerging Technologies and Circuits. It contains a set of outstanding papers, keynote and tutorials presented during 3 days at the International Conference On Integrated Circuit Design and Technology (ICICDT) held in June 2008 in Minatec, Grenoble. The selected papers are spread over 5 chapters covering various aspects of emerging technologies and devices, advanced circuit design, reliability, variability issues and solutions, advanced memories and analog and mixed signals. All these papers are focusing on design and technology interactions and comply with the scope of the conference | ||
| 700 | 1 | |a Amara, Amara. |4 pbd | |
| 700 | 1 | |a Ea, Thomas, |d 1972- |4 pbd | |
| 700 | 1 | |a Belleville, Marc, |d 19..-...., |c auteur en nanoélectronique. |4 pbd | |
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