Advanced Computing in Electron Microscopy
Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. T...
Kaydedildi:
| Yazar: | |
|---|---|
| Materyal Türü: | Livre numérique |
| Dil: | Anglais |
| Baskı/Yayın Bilgisi: |
New York, NY :
Springer US
[20..].
Cham : Springer Nature |
| Edisyon: | 2nd ed. 2010. |
| Online Erişim: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Not: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Advanced Computing in Electron Microscopy, Texte imprimé, 9781441965325 |
| LEADER | 02862nam a22003257a 4500 | ||
|---|---|---|---|
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| 008 | 110106q2000 xx ||| |||| 00| 0 eng d | ||
| 009 | PPN149017286 | ||
| 020 | |a 9781441965332 | ||
| 020 | |a 9781441965332 | ||
| 041 | 0 | |a eng | |
| 082 | |a 620.11 | ||
| 100 | 1 | |a Kirkland, Earl J. | |
| 245 | 1 | 0 | |a Advanced Computing in Electron Microscopy |c by Earl J. Kirkland. |
| 250 | |a 2nd ed. 2010. | ||
| 260 | |a New York, NY : |b Springer US. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a The Transmission Electron Microscope Linear Image Approximations Sampling and the Fast Fourier Transform Calculation of Images of Thin Specimens Theory of Calculation of Images of Thick Specimens Multislice Applications and Examples The Programs Plotting Transfer Functions The Fourier Projection Theorem Atomic Potentials and Scattering Factors Bilinear Interpolation 3D Perspective View | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field. This enhanced second edition includes: -descriptions of new developments in the field -updated references -additional material on aberration corrected instruments and confocal electron microscopy -expanded and improved examples and sections to provide stronger clarity | ||
| 776 | 0 | |t Advanced Computing in Electron Microscopy |b Texte imprimé |z 9781441965325 | |
| 856 | 4 | |q PDF |u https://doi.org/10.1007/978-1-4419-6533-2 |z Accès sur la plateforme de l'éditeur | |
| 856 | 4 | |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-WM3821CK-C |z Accès sur la plateforme Istex | |
| 856 | 4 | |5 452349901:747836701 |u https://ezproxy.univ-orleans.fr/login?url=https://dx.doi.org/10.1007/978-1-4419-6533-2 |z Accès Université d'Orléans | |
| 856 | 4 | |5 180339901:750854219 |u https://ezproxy.insa-cvl.fr/login?qurl=https://dx.doi.org/10.1007/978-1-4419-6533-2 |z Accès INSA CVL | |
| 997 | |0 942094 |1 Livre numérique |a Ressource numérique |b INSA |b ENSA |c 0/Bibliothèque numérique/ |c 1/Bibliothèque numérique/Autre ressource numérique/ | ||