Electromagnetic compatibility for device design and system integration

The Electromagnetic Compatibility has become an increasingly essential factor for placing a product on the global, world wide market. Fulfilling emission limits and immunity requirements as well as handling apparently complex cases of incompatibility demands a deeper understanding of the physical in...

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Auteurs principaux: Gonschorek, Karl-Heinz, Vick, Ralf (Auteur)
Formato: Livre numérique
Idioma:Anglais
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg 2009.
Cham : Springer Nature
Acceso en liña:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
Nota: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Electromagnetic Compatibility for Device Design and System Integration, Texte imprimé, 9783642032899
• Electromagnetic Compatibility for Device Design and System Integration, Texte imprimé, 9783642033308
• Electromagnetic Compatibility for Device Design and System Integration, Texte imprimé, 9783642424236
LEADER 03496nam a22003377a 4500
001 941929
008 100125s2009 xx ||| |||| 00| 0 eng d
009 PPN139954929
020 |a 9783642032905 
041 0 |a eng 
082 |a 621.381 
100 1 |a Gonschorek, Karl-Heinz. 
245 1 0 |a Electromagnetic compatibility for device design and system integration   |c by Karl-Heinz Gonschorek, Ralf Vick. 
260 |a Berlin, Heidelberg :  |b Springer Berlin Heidelberg. 
260 |a Cham :  |b Springer Nature,  |c 2009. 
500 |a Archives Springer e-books (Licence nationale) 
500 |a Archives Springer e-books (Licence nationale) 
505 0 |a Motivation and Overview -- Thinking in Voltages, Currents, Fields and Impedances -- Electric Fields -- Magnetic Fields -- Electromagnetic Fields -- The Interference Model -- Intrasystem Measures -- Atmospheric Noise, Electromagnetic Environment and Limit Values -- EMC Engineering and Analysis -- Numerical Techniques for Field Calculation -- Model for Immunity Testing -- Electric Fields of Rod Arrangements -- Magnetic Stray Fields -- Self and Mutual Inductances -- Elementary Dipoles -- The Polarization Ellipsis -- Skin Effect and Shielding Theory of Schelkunoff -- Example of an EMC-Design Guide for Systems -- 25 EMC-Rules for the PCB-Layout and the Device Construction -- Easy-to-use Procedure for Predicting the Cable Transfer Impedance -- Capacitances and Inductances of Common Interest -- Reports of Electromagnetic Incompatibilities -- Solutions to the Exercises -- Physical Constants and Conversion Relations. 
506 |a Accès en ligne pour les établissements français bénéficiaires des licences nationales 
506 |a Accès soumis à abonnement pour tout autre établissement 
506 |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. chttps://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 
520 |a The Electromagnetic Compatibility has become an increasingly essential factor for placing a product on the global, world wide market. Fulfilling emission limits and immunity requirements as well as handling apparently complex cases of incompatibility demands a deeper understanding of the physical interrelations and of Maxwell's theory. Based on the authors experiences, the textbook provides some help in solving such interferential cases. It contains many illustrative examples and more than 80 exercises with solutions. 
700 1 |a Vick, Ralf.  |4 aut 
776 0 |t Electromagnetic Compatibility for Device Design and System Integration  |b Texte imprimé  |z 9783642032899 
776 0 |t Electromagnetic Compatibility for Device Design and System Integration  |b Texte imprimé  |z 9783642033308 
776 0 |t Electromagnetic Compatibility for Device Design and System Integration  |b Texte imprimé  |z 9783642424236 
856 4 |q PDF  |u https://doi.org/10.1007/978-3-642-03290-5  |z Accès sur la plateforme de l'éditeur 
856 4 |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-6HGJLNJ4-B  |z Accès sur la plateforme Istex 
856 4 |5 452349901:747841896  |u https://ezproxy.univ-orleans.fr/login?url=https://doi.org/10.1007/978-3-642-03290-5  |z Accès Université d'Orléans 
856 4 |5 180339901:750859431  |u https://ezproxy.insa-cvl.fr/login?qurl=https://doi.org/10.1007/978-3-642-03290-5  |z Accès INSA CVL 
997 |0 941929  |1 Livre numérique  |a Ressource numérique  |b INSA  |b ENSA  |c 0/Bibliothèque numérique/  |c 1/Bibliothèque numérique/Autre ressource numérique/