Particle Size Measurements : Fundamentals, Practice, Quality
Following my graduation in physical organic chemistry at the University of Amst- dam, I started to work at the Royal Dutch Shell Laboratories in Amsterdam. My first assignment was research in the field of detergents and industrial chemicals. It was followed by development work on thermal wax crackin...
Gardado en:
| Autor Principal: | |
|---|---|
| Outros autores: | , |
| Formato: | Livre numérique |
| Idioma: | Anglais |
| Publicado: |
Dordrecht :
Springer Netherlands
[20..].
Cham : Springer Nature |
| Edición: | 1st ed. 2009. |
| Series: | Particle Technology Series
17 |
| Acceso en liña: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
L'impression du document génère 534 p. Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Particle size measurements, fundamentals, practice, quality, Henk G. Merkus, [London], Springer, 2009, 1 vol. (xii-533 p.), Particle Technology Series, 978-1-4020-9015-8 • Particle Size Measurements, Texte imprimé, 9781402090233 • Particle Size Measurements, Texte imprimé, 9789048180523 • Particle size measurements, fundamentals, practice, quality, Henk G. Merkus, [London], Springer, 2009, 1 vol. (xii-533 p.), Particle Technology Series, 978-1-4020-9015-8 |
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| 100 | 1 | |a Merkus, Henk G. | |
| 245 | 1 | 0 | |a Particle Size Measurements : |b Fundamentals, Practice, Quality |c by Henk G. Merkus ; edited by Brian Scarlett, Maria Bellantone. |
| 250 | |a 1st ed. 2009. | ||
| 260 | |a Dordrecht : |b Springer Netherlands. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a Particle Technology Series |v 17 | |
| 500 | |a L'impression du document génère 534 p. | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a Particle Size, Size Distributions and Shape Quality Aspects in Particulate Analysis Sampling of Particulate Material Dispersion of Powders in Air and in Liquids Overview of Size Characterization Techniques Microscopy and Image Analysis Sieves and Sieving Electrical Sensing Zone Laser Diffraction Ultrasound Extinction Dynamic Light Scattering Sedimentation Techniques In- and On-Line Measurement Written Standards Reference Materials Quality Management and Calibration Definitions and Symbols Multilingual Terminology Statistical Background | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Following my graduation in physical organic chemistry at the University of Amst- dam, I started to work at the Royal Dutch Shell Laboratories in Amsterdam. My first assignment was research in the field of detergents and industrial chemicals. It was followed by development work on thermal wax cracking for production of C C 2 14 olefins and on acid-catalyzed synthesis of carboxylic acids from C C olefins. 3 6 Then, I made a significant change to analytical chemistry, first at Shell s process development department and later in the chemical engineering department of Delft University of Technology. In both departments, there was a large variety of analy- cal techniques and development of new methods for automated analysis of small process streams. It was the time that gas chromatography conquered the world. In this field, a firm basis was given by Henk Boer, Arie Kwantes and Frits Zuiderweg at Shell Research Laboratories in Amsterdam, both for packed and for capillary c- umns. The potential of gas chromatography was huge and, therefore, also in Delft, its use increased enormously. Moreover, the growth of this technique was facilitated significantly by the rapidly developing electronics industry. It not only led to digital peak integrators and personal computers but also enabled complex measurement techniques. In addition, I became involved in surface area and porosity characteri- tion of catalysts and adsorbents, on which topic the research had been initiated by Prof. J. H. de Boer | ||
| 700 | 1 | |a Bellantone, Maria. |4 edt | |
| 700 | 1 | |a Scarlett, Brian. |4 edt | |
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