Transmission electron microscopy : physics of image formation
Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for eval...
Uloženo v:
| Hlavní autoři: | , |
|---|---|
| Médium: | Livre numérique |
| Jazyk: | Anglais |
| Vydáno: |
New York, NY :
Springer New York
[20..].
Cham : Springer Nature |
| Vydání: | 5th ed. 2008. |
| Edice: | Springer Series in Optical Sciences
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| On-line přístup: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Poznámka: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Transmission Electron Microscopy, Texte imprimé, 9780387564142 • Transmission Electron Microscopy, Texte imprimé, 9781441923080 • Transmission electron microscopy, physics of image formation, L. Reimer, H. Kohl, 5th edition, 2008, Berlin, Springer, 1 vol. (XVI-587 p.), Springer series in optical sciences, 978-0-387-40093-8 |
Obsah:
- Particle Optics of Electrons Wave Optics of Electrons Elements of a Transmission Electron Microscope Electron-Specimen Interactions. Scattering and Phase Contrast Theory of Electron Diffraction Electron-Diffraction Modesand Applications . Imaging of Crystalline Specimens and Their Defects. Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy. Specimen Damage by Electron Irradiation.