Transmission electron microscopy : physics of image formation
Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for eval...
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Livre numérique |
| Language: | Anglais |
| Published: |
New York, NY :
Springer New York
[20..].
Cham : Springer Nature |
| Edition: | 5th ed. 2008. |
| Series: | Springer Series in Optical Sciences
|
| Online Access: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Note: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Transmission Electron Microscopy, Texte imprimé, 9780387564142 • Transmission Electron Microscopy, Texte imprimé, 9781441923080 • Transmission electron microscopy, physics of image formation, L. Reimer, H. Kohl, 5th edition, 2008, Berlin, Springer, 1 vol. (XVI-587 p.), Springer series in optical sciences, 978-0-387-40093-8 |
| LEADER | 03796nam a22003497a 4500 | ||
|---|---|---|---|
| 001 | 941070 | ||
| 008 | 090420q2000 xx ||| |||| 00| 0 eng d | ||
| 009 | PPN132863138 | ||
| 020 | |a 9780387347585 | ||
| 041 | 0 | |a eng | |
| 100 | 1 | |a Kohl, Helmut, |d 19..- | |
| 245 | 1 | 0 | |a Transmission electron microscopy : |b physics of image formation |c by Helmut Kohl, Ludwig Reimer. |
| 250 | |a 5th ed. 2008. | ||
| 260 | |a New York, NY : |b Springer New York. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a Springer Series in Optical Sciences |x 1556-1534 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a Particle Optics of Electrons Wave Optics of Electrons Elements of a Transmission Electron Microscope Electron-Specimen Interactions. Scattering and Phase Contrast Theory of Electron Diffraction Electron-Diffraction Modesand Applications . Imaging of Crystalline Specimens and Their Defects. Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy. Specimen Damage by Electron Irradiation. | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration correction and energy filtering; moreover, the topics introduced in the fourth edition have been updated. Transmission Electron Microscopy: Physics of Image Formation is written for scientists and application engineers in fields such as physics, chemistry, mineralogy, materials science and biology. Researchers, students, and other users of a transmission electron microscope can also benefit from this text. | ||
| 700 | 1 | |a Reimer, Ludwig, |d 1928- |4 aut | |
| 776 | 0 | |t Transmission Electron Microscopy |b Texte imprimé |z 9780387564142 | |
| 776 | 0 | |t Transmission Electron Microscopy |b Texte imprimé |z 9781441923080 | |
| 776 | 0 | |0 129175935 |t Transmission electron microscopy |o physics of image formation |f L. Reimer, H. Kohl |e 5th edition |d 2008 |c Berlin |n Springer |p 1 vol. (XVI-587 p.) |s Springer series in optical sciences |z 978-0-387-40093-8 | |
| 856 | 4 | |q PDF |u https://doi.org/10.1007/978-0-387-40093-8 |z Accès sur la plateforme de l'éditeur | |
| 856 | 4 | |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-LH4CJ6V5-D |z Accès sur la plateforme Istex | |
| 856 | 4 | |5 452349901:747854769 |u https://ezproxy.univ-orleans.fr/login?url=https://dx.doi.org/10.1007/978-0-387-40093-8 |z Accès Université d'Orléans | |
| 856 | 4 | |5 180339901:75087225X |u https://ezproxy.insa-cvl.fr/login?qurl=https://dx.doi.org/10.1007/978-0-387-40093-8 |z Accès INSA CVL | |
| 997 | |0 941070 |1 Livre numérique |a Ressource numérique |b INSA |b ENSA |c 0/Bibliothèque numérique/ |c 1/Bibliothèque numérique/Autre ressource numérique/ | ||