Microscopy of semiconducting materials : 2007
The fifteenth international conference on Microscopy of Semiconducting Materials took place in Cambridge, UK on 2-5 April 2007. It was organised by the Institute of Physics, with co-sponsorship by the Royal Microscopical Society and endorsement by the Materials Research Society. The conference focus...
Zapisane w:
| Kolejni autorzy: | , |
|---|---|
| Format: | Livre numérique |
| Język: | Anglais |
| Wydane: |
Dordrecht :
Springer Netherlands : Springer e-books
[20..].
Cham : Springer Nature |
| Seria: | Springer Proceedings in Physics
120 |
| Dostęp online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Komentarz: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Microscopy of semiconducting materials, proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK, A.G.Cullis, P.A. Midgley, eds., Dordrecht, Netherlands, Springer, 2008, 1 vol. (XIV-497 p.), Springer proceedings in physics, 978-1-4020-8614-4 |
Spis treści:
- Wide Band-Gap Nitrides General Heteroepitaxial Layers High Resolution Microscopy and Nanoanalysis Self-Organised and Quantum Domain Structures Processed Silicon and Other Device Materials Device and Doping Studies FIB, SEM and SPM Advances