EMC 2008 14th European Microscopy Congress 1 5 September 2008, Aachen, Germany. Volume 1, Instrumentation and Methods
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the c...
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| Format: | Livre numérique |
| Sprache: | Anglais |
| Veröffentlicht: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Online Zugang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Anmerkung: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Variante du titre: | 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany |
| Edition sous un autre format: | • EMC 2008 14th European Microscopy Congress 1 5 September 2008, Aachen, Germany, Texte imprimé, 9783540873389 • EMC 2008, 14th European Microscopy Congress, 1-5 september 2008, Aachen, Germany, Volume 1, instrumentation and methods, Martina Luysberg, Karsten Tillmann, Thomas Weirich, editors, Berlin, Springer Verlag, 2008, 1 vol. (XXXVIII-862 p.), 978-3-540-85154-7 • EMC 2008 14th European Microscopy Congress 1 5 September 2008, Aachen, Germany, Texte imprimé, 9783662502259 |
Inhaltsangabe:
- Instrumentation and Methods TEM and STEM instrumentation and Electron Optics TEM and STEM methods SEM/FIB Instrumentation and Methods Other Microscopies Image analysis and Processing Sample Preparation for Materials Science and Biology.

