Evolution of thin film morphology : modeling and simulations
Thin film deposition is the most ubiquitous and critical of the processes used to manufacture high tech devices. Morphology and microstructure of thin films directly controls their optical, magnetic, and electrical properties. This book focuses on modeling and simulations used in research on the mor...
Gardado en:
| Auteurs principaux: | , |
|---|---|
| Formato: | Livre numérique |
| Idioma: | Anglais |
| Publicado: |
New York, NY :
Springer New York
[20..].
Cham : Springer Nature |
| Edición: | 1st ed. 2008. |
| Series: | Springer Series in Materials Science
108 |
| Sujets: | |
| Acceso en liña: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Evolution of thin-film morphology, modeling and simulations, Matthew Pelliccione and Toh-Ming Lu, Berlin, Springer, 2008, 1 vol. (XI- 204 p.), Springer series in materials science, 978-0-387-75108-5 |
Table des matières:
- Description of Thin Film Morphology Surface Statistics Self-Affine Surfaces Mounded Surfaces Continuum Surface Growth Models Stochastic Growth Equations Small World Growth Model Discrete Surface Growth Models Monte Carlo Simulations Solid-on-Solid Models Ballistic Aggregation Models Concluding Remarks