Evolution of thin film morphology : modeling and simulations
Thin film deposition is the most ubiquitous and critical of the processes used to manufacture high tech devices. Morphology and microstructure of thin films directly controls their optical, magnetic, and electrical properties. This book focuses on modeling and simulations used in research on the mor...
Đã lưu trong:
| Những tác giả chính: | , |
|---|---|
| Định dạng: | Livre numérique |
| Ngôn ngữ: | Anglais |
| Được phát hành: |
New York, NY :
Springer New York
[20..].
Cham : Springer Nature |
| Phiên bản: | 1st ed. 2008. |
| Loạt: | Springer Series in Materials Science
108 |
| Những chủ đề: | |
| Truy cập trực tuyến: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Chú thích: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Evolution of thin-film morphology, modeling and simulations, Matthew Pelliccione and Toh-Ming Lu, Berlin, Springer, 2008, 1 vol. (XI- 204 p.), Springer series in materials science, 978-0-387-75108-5 |