Transmission electron microscopy and diffractometry of materials
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of th...
Salvato in:
| Autori principali: | , |
|---|---|
| Natura: | Livre numérique |
| Lingua: | Anglais |
| Pubblicazione: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
2008.
Cham : Springer Nature |
| Accesso online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Transmission electron microscopy and diffractometry of materials, Brent Fultz, James Howe, 3eme édition, Berlin, Springer, 2008, 1 vol. (xix- 758 p.), 3-540-73885-1 • Transmission Electron Microscopy and Diffractometry of Materials, Texte imprimé, 9783540841531 |
Sommario:
- Diffraction and the X-Ray Powder Diffractometer
- The TEM and its Optics
- Scattering
- Inelastic Electron Scattering and Spectroscopy
- Diffraction from Crystals
- Electron Diffraction and Crystallography
- Diffraction Contrast in TEM Images
- Diffraction Lineshapes
- Patterson Functions and Diffuse Scattering
- High-Resolution TEM Imaging
- High-Resolution STEM Imaging
- Dynamical Theory.