Low-frequency noise in advanced MOS devices
Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-fre...
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| 主要な著者: | , , |
|---|---|
| フォーマット: | Livre numérique |
| 言語: | Anglais |
| 出版事項: |
Dordrecht :
Springer Netherlands
[20..].
Cham : Springer Nature |
| 版: | 1st ed. 2007. |
| シリーズ: | Analog Circuits and Signal Processing
|
| オンライン･アクセス: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| 注記: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Low-frequency noise in advanced MOS devices, by Martin von Haartman and Mikael Östling, Dordrecht, Springer, 2007, 1 vol. (xiii-216 p.), Analog circuits and signal processing series, 1-402-05909-4 • Low-Frequency Noise in Advanced MOS Devices, Texte imprimé, 9789048174720 • Low-Frequency Noise in Advanced MOS Devices, Texte imprimé, 9789048112753 |
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| 245 | 1 | 0 | |a Low-frequency noise in advanced MOS devices |c by Martin von Haartman, Mikael Östling. |
| 250 | |a 1st ed. 2007. | ||
| 260 | |a Dordrecht : |b Springer Netherlands. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
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| 500 | |a Archives Springer e-books (Licence nationale) | ||
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| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits | ||
| 700 | 1 | |a Östling, Mikael, |d 19..- |4 aut | |
| 700 | 1 | |a Östling, Mikael. |4 aut | |
| 776 | 0 | |0 131275313 |t Low-frequency noise in advanced MOS devices |f by Martin von Haartman and Mikael Östling |c Dordrecht |n Springer |d 2007 |p 1 vol. (xiii-216 p.) |s Analog circuits and signal processing series |z 1-402-05909-4 | |
| 776 | 0 | |t Low-Frequency Noise in Advanced MOS Devices |b Texte imprimé |z 9789048174720 | |
| 776 | 0 | |t Low-Frequency Noise in Advanced MOS Devices |b Texte imprimé |z 9789048112753 | |
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