Digital Noise Monitoring of Defect Origin

Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determin...

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Bibliografiske detaljer
Hovedforfatter: Aliev, Telman
Format: Livre numérique
Sprog:Anglais
Udgivet: New York, NY : Springer US 2007.
Cham : Springer Nature
Serier:Lecture Notes in Electrical Engineering 2
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Kommentar: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
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Edition sous un autre format:• Digital Noise Monitoring of Defect Origin, Texte imprimé, 9780387717531
• Digital Noise Monitoring of Defect Origin, Texte imprimé, 9780387518831
• Digital Noise Monitoring of Defect Origin, Texte imprimé, 9781441944108
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245 1 0 |a Digital Noise Monitoring of Defect Origin   |c by Telman Aliev. 
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490 0 |a Lecture Notes in Electrical Engineering  |v 2  |x 1876-1119 
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505 0 |a Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features -- Position-Binary Technology of Monitoring Defect at its Origin -- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin -- Robust Correlation Monitoring of a Defect at its Origin -- Spectral Monitoring of a Defect's Origin -- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier -- The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier. 
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506 |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. chttps://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 
520 |a Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects. 
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