Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces
Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a l...
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| Главный автор: | |
|---|---|
| Формат: | Livre numérique |
| Язык: | Anglais |
| Опубликовано: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Редактирование: | 1st ed. 2006. |
| Серии: | NanoScience and Technology
|
| Online-ссылка: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Примечание: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching, application to rough and natural surfaces, G. Kaupp, Berlin, Springer, 2006, 1 vol. (XII-292 p.), NanoScience and technology, 3-540-28405-2 |
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| 100 | 1 | |a Kaupp, Gerd. | |
| 245 | 1 | 0 | |a Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : |b Application to Rough and Natural Surfaces |c by Gerd Kaupp. |
| 250 | |a 1st ed. 2006. | ||
| 260 | |a Berlin, Heidelberg : |b Springer Berlin Heidelberg. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a NanoScience and Technology |x 2197-7127 | |
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| 505 | 1 | |a Atomic Force Microscopy Scanning Near-Field Optical Microscopy Nanoindentation Nanoscratching | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples | ||
| 776 | 0 | |0 109049586 |t Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching |o application to rough and natural surfaces |f G. Kaupp |c Berlin |n Springer |d 2006 |p 1 vol. (XII-292 p.) |s NanoScience and technology |z 3-540-28405-2 | |
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