Kaupp, G. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (1st ed. 2006.). Springer Berlin Heidelberg.
Citace podle Chicago (17th ed.)Kaupp, Gerd. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces. 1st ed. 2006. Berlin, Heidelberg: Springer Berlin Heidelberg.
Citace podle MLA (8th ed.)Kaupp, Gerd. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces. 1st ed. 2006. Springer Berlin Heidelberg.
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