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217670 |
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751229t19761976xxe ||| |||| 00| 0 eng d |
| 009 |
PPN017108209 |
| 020 |
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|a 0080196926 (rel.)
|
| 041 |
0 |
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|a eng
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| 082 |
|
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|a 548/.83
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| 100 |
1 |
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|a Tanner, Brian Keith.
|
| 245 |
1 |
0 |
|a X-ray diffraction topography
|c by B. K. Tanner,...
|
| 260 |
|
|
|a Oxford ;
|a New York (N. Y.) ;
|a Toronto :
|b Pergamon Press,
|c cop. 1976.
|
| 300 |
|
|
|a 1 vol. (xiii-174 p.) :
|b ill., couv. ill. en coul. ;
|c 26 cm.
|
| 490 |
0 |
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|a International series in the science of the solid state
|v 10
|
| 504 |
|
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|a Notes bibliogr. Index
|
| 650 |
|
|
|a Radiocristallographie
|
| 997 |
|
|
|0 217670
|1 Livre papier
|a Ressource papier
|c 0/Orléans/
|c 1/Orléans/OSUC/
|z Orléans, OSUC, 548.83 TAN
|
