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871215s1986 xxe ||| |||| 00| 0 eng d |
| 009 |
PPN005526450 |
| 020 |
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|a 0387158332 (Springer-Verlag New York) (relié)
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| 020 |
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|a 3540158332 (Springer-Verlag Berlin) (relié)
|
| 041 |
0 |
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|a eng
|
| 082 |
|
|
|a 543.085 86
|
| 100 |
1 |
|
|a Teo, Boon Keng.
|
| 245 |
1 |
0 |
|a EXAFS :
|b [Extended X-ray Absorption Fine Structure] : Basic principles and data analysis
|c Boon K. Teo.
|
| 260 |
|
|
|a Berlin :
|b Springer-Verlag,
|c c1986.
|
| 300 |
|
|
|a 1 volume (XVIII-349 pages) :
|b illustration ;
|c 25 cm.
|
| 490 |
1 |
|
|a Inorganic chemistry concepts
|v 9
|
| 504 |
|
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|a Bibliographie pages 223-284. Index
|
| 650 |
|
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|a Spectroscopie des rayons X
|
| 650 |
|
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|a Structure hyperfine
|
| 650 |
|
|
|a Spectrométrie EXAFS
|
| 650 |
|
|
|a Rayons X
|
| 997 |
|
|
|0 183182
|1 Livre papier
|a Ressource papier
|c 0/Orléans/
|c 1/Orléans/BU Sciences, Technologies, STAPS/
|z Orléans, BU Sciences, Technologies, STAPS, C6111
|
