Klapetek, P. (2018). Quantitative data processing in scanning probe microscopy: SPM applications for nanometrology. Elsevier Science.
Citazione stile Chigago Style (17a edizione)Klapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. San Diego: Elsevier Science, 2018.
Citatione MLA (8a ed.)Klapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. Elsevier Science, 2018.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.